Sobeeh Almukhaizim

Publication Activity (10 Years)

Years Active: 2001-2013
Publications (10 Years): 0

Top Topics

Mutual Exclusion

Power Reduction

Training And Test Data

Top Venues

J. Electron. Test.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Samah Mohamed Saeed, Ozgur Sinanoglu, Sobeeh Almukhaizim
Predictive Techniques for Projecting Test Data Volume Compression. IEEE Trans. Very Large Scale Integr. Syst. 21 (9) (2013)
Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints. J. Electron. Test. 29 (1) (2013)
Sobeeh Almukhaizim, Ozgur Sinanoglu
Novel hazard-free majority voter for n-modular redundancy-based fault tolerance in asynchronous circuits. IET Comput. Digit. Tech. 5 (4) (2011)
Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim
Analysis of the soft error susceptibility and failure rate in logic circuits. Int. Arab J. Inf. Technol. 8 (4) (2011)
Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu
Test power reduction via deterministic alignment of stimulus and response bits. LATW (2011)
Ozgur Sinanoglu, Sobeeh Almukhaizim
Unified 2-D X-Alignment for Improving the Observability of Response Compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (11) (2011)
Sobeeh Almukhaizim, Ozgur Sinanoglu
Error-resilient design of branch predictors for effective yield improvement. LATW (2011)
Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu
Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits. J. Low Power Electron. 7 (4) (2011)
Ozgur Sinanoglu, Sobeeh Almukhaizim
Predictive analysis for projecting test compression levels. ITC (2010)
Junxia Ma, Mohammad Tehranipoor, Ozgur Sinanoglu, Sobeeh Almukhaizim
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG. IDT (2010)
Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah
Low-power test in compression-based reconfigurable scan architectures. SBCCI (2010)
Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu
Reconfigurable low-power Concurrent Error Detection in logic circuits. IOLTS (2010)
Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu
Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. ETS (2010)
Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Eman AlQuraishi
Cost-free low-power test in compression-based reconfigurable scan designs. IDT (2010)
Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu
Reconfigurable low-power Concurrent Error Detection in logic circuits. IDT (2010)
Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah
Test power reduction in compression-based reconfigurable scan architectures. ETS (2010)
Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power. J. Electron. Test. 26 (4) (2010)
Ozgur Sinanoglu, Sobeeh Almukhaizim
X-Align: Improving the Scan Cell Observability of Response Compactors. IEEE Trans. Very Large Scale Integr. Syst. 17 (10) (2009)
Sobeeh Almukhaizim, Ozgur Sinanoglu
Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (2) (2009)
Sobeeh Almukhaizim, Feng Shi, Eric Love, Yiorgos Makris
Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits. IEEE Trans. Very Large Scale Integr. Syst. 17 (7) (2009)
Ozgur Sinanoglu, Sobeeh Almukhaizim
X-alignment techniques for improving the observability of response compactors. ITC (2009)
Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. IOLTS (2008)
Sobeeh Almukhaizim, Ozgur Sinanoglu
Peak Power Reduction Through Dynamic Partitioning of Scan Chains. ITC (2008)
Sobeeh Almukhaizim, Yiorgos Makris
Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires. IEEE Trans. Reliab. 57 (1) (2008)
Sobeeh Almukhaizim, Feng Shi, Yiorgos Makris
Coping with Soft Errors in Asynchronous Burst-Mode Machines. ASYNC (2008)
Sobeeh Almukhaizim, Yiorgos Makris
Concurrent Error Detection Methods for Asynchronous Burst-Mode Machines. IEEE Trans. Computers 56 (6) (2007)
Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris
Seamless Integration of SER in Rewiring-Based Design Space Exploration. ITC (2006)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (8) (2006)
Sobeeh Almukhaizim, Yiorgos Makris
Berger code-based concurrent error detection in asynchronous burst-mode machines. DATE (2006)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
Compaction-based concurrent error detection for digital circuits. Microelectron. J. 36 (9) (2005)
Sobeeh Almukhaizim, Yiorgos Makris
Concurrent Error Detection in Asynchronous Burst-Mode Controllers. DATE (2005)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
On Concurrent Error Detection with Bounded Latency in FSMs. DATE (2004)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
Cost-Driven Selection of Parity Trees. VTS (2004)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction. ISQED (2004)
Feng Shi, Sobeeh Almukhaizim, Pey-Chang Lin, Yiorgos Makris
Compiler-Based Frame Formation for Static Optimization. ICCD (2004)
Sobeeh Almukhaizim, Yiorgos Makris
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code. DFT (2003)
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris
On Compaction-Based Concurrent Error Detection. IOLTS (2003)
Sobeeh Almukhaizim, Thomas Verdel, Yiorgos Makris
Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case. ICCD (2003)
Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu
Low-cost, software-based self-test methodologies for performance faults in processor control subsystems. CICC (2001)
Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu
Faults in Processor Control Subsystems: Testing Correctness and Performance Faults in the Data Prefetching Unit. Asian Test Symposium (2001)