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Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test.
Sobeeh Almukhaizim
Ozgur Sinanoglu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
Keyphrases
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power consumption
dynamic environments
power reduction
database
neural network
social networks
test cases
test data
partitioning algorithm
data sets
artificial intelligence
information systems
video sequences
statistically significant
significantly reduced
dynamically changing