Low-cost, software-based self-test methodologies for performance faults in processor control subsystems.
Sobeeh AlmukhaizimPeter PetrovAlex OrailogluPublished in: CICC (2001)
Keyphrases
- low cost
- test cases
- single chip
- software testing
- data acquisition
- fault isolation
- industry standard
- embedded systems
- software development
- test data generation
- diagnostic tests
- design patterns
- software systems
- control system
- high end
- low power
- data mining
- software tools
- test suite
- software quality
- control strategy
- control method
- development process
- real time
- real world
- built in self test
- intelligent software
- extreme programming
- agent based systems
- software metrics
- software design
- hardware and software
- parallel processing
- software architecture
- user interface