Compaction-based concurrent error detection for digital circuits.
Sobeeh AlmukhaizimPetros DrineasYiorgos MakrisPublished in: Microelectron. J. (2005)
Keyphrases
- digital circuits
- error detection
- error correction
- error recovery
- fault tolerance
- fault isolation
- error correcting
- data cleansing
- error resilient
- data flow
- evolvable hardware
- model based diagnosis
- finite state machines
- circuit design
- error control
- fault tolerant
- pattern matching
- functional decomposition
- dynamic systems
- heuristic search