Cost-free low-power test in compression-based reconfigurable scan designs.
Sobeeh AlmukhaizimMohammad Gh. MohammadEman AlQuraishiPublished in: IDT (2010)
Keyphrases
- low power
- low cost
- high speed
- power consumption
- power reduction
- single chip
- nm technology
- high power
- wireless transmission
- low power consumption
- digital signal processing
- logic circuits
- vlsi circuits
- hardware and software
- image sensor
- vlsi architecture
- compression algorithm
- real time
- gate array
- image compression
- general purpose
- lossless compression