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On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.

Akihiro TomitaXiaoqing WenYasuo SatoSeiji KajiharaKohei MiyaseStefan HolstPatrick GirardMohammad TehranipoorLaung-Terng Wang
Published in: IEICE Trans. Inf. Syst. (2014)
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