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Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits.
Mahmut Yilmaz
Krishnendu Chakrabarty
Mohammad Tehranipoor
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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integrated circuit
printed circuit boards
built in self test
small number
electron beam
neural network
pattern detection
pattern matching
test data
pattern discovery
statistical tests
cervical cancer