Fanchen Zhang

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 5

Top Topics

Rotating Machinery

Fault Detection

Tennessee Eastman

Top Venues

J. Electron. Test.

Publications

Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. 39 (2) (2023)
Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electron. Test. 35 (6) (2019)
Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak
One more time! Increasing fault detection with scan shift capture. NATW (2018)
Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. NATW (2016)
Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC (2016)
Fanchen Zhang, Micah Thornton, Jennifer Dworak
When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. NATW (2014)