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When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG.
Fanchen Zhang
Micah Thornton
Jennifer Dworak
Published in:
NATW (2014)
Keyphrases
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test set
test cases
detection method
error rate
detection algorithm
training data
high quality
feature space
training set
data mining
image processing
dynamic systems