Li-C. Wang

ORCID

Publication Activity (10 Years)

Years Active: 1993-2024
Publications (10 Years): 32

Top Venues

Publications

Yueling Jenny Zeng, Li-C. Wang, Thomas Ibbetson
Oracle-Checker Scheme for Evaluating a Generative Large Language Model. CoRR (2024)
Li-C. Wang, Jeff Rearick
Welcome Message ITC 2023. ITC (2023)
Yueling Zeng, Li-C. Wang
Domain Knowledge Graph Construction Via A Simple Checker. CoRR (2023)
Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. ITC (2023)
Min Jian Yang, Yueling Zeng, Li-C. Wang
Language Driven Analytics for Failure Pattern Feedforward and Feedback. ITC (2022)
Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang
Wafer Map Pattern Analytics Driven By Natural Language Queries. ITC-Asia (2022)
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan
MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. ITC (2021)
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
Learning A Wafer Feature With One Training Sample. ITC (2020)
Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
Deploying A Machine Learning Solution As A Surrogate. ITC (2019)
Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba
Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. ICCAD (2019)
Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa
Wafer Pattern Recognition Using Tucker Decomposition. VTS (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT (2019)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Concept Recognition in Production Yield Data Analytics. ITC (2018)
Li-C. Wang
Machine Learning for Feature-Based Analytics. ISPD (2018)
Li-C. Wang
An Autonomous System View To Apply Machine Learning. ITC (2018)
Kuo-Kai Hsieh, Li-C. Wang
A Concept Learning Tool Based On Calculating Version Space Cardinality. CoRR (2018)
Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang
Special session on machine learning for test and diagnosis. VTS (2018)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Discovering Interesting Plots in Production Yield Data Analytics. CoRR (2018)
Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang
Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification. IEEE Des. Test 34 (5) (2017)
Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang
Challenges and Trends in Modern SoC Design Verification. IEEE Des. Test 34 (5) (2017)
Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC (2017)
Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
Some considerations on choosing an outlier method for automotive product lines. ITC (2017)
Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
Learning the process for correlation analysis. VTS (2017)
Ahmed Wahba, Justin Hohnerlein, Farhan Rahman, Li-C. Wang
Dynamic Exerciser Template Weighting in x86 Processor Verification. MTV (2017)
Li-C. Wang
Experience of Data Analytics in EDA and Test - Principles, Promises, and Challenges. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (6) (2017)
Nik Sumikawa, Matt Nero, Li-C. Wang
Kernel based clustering for quality improvement and excursion detection. ITC (2017)
Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra
Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery. DAC (2017)
Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra
Feature extraction from design documents to enable rule learning for improving assertion coverage. ASP-DAC (2017)
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
Consistency in wafer based outlier screening. VTS (2016)
Suriyaprakash Natarajan, Li-C. Wang
Session 4B - Panel data analytics in semiconductor manufacturing. VTS (2016)
Ron Press, Li-C. Wang
ITC and the Future of Test - We've Won. IEEE Des. Test 33 (6) (2016)
Li-C. Wang
Data mining in functional test content optimization. ASP-DAC (2015)
Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch
Generalization of an outlier model into a "global" perspective. ITC (2015)
Li-C. Wang, Malgorzata Marek-Sadowska
Machine Learning in Simulation-Based Analysis. ISPD (2015)
Li-C. Wang
Design trends and test challenges in automotive electronics. VLSI-DAT (2014)
Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra
On application of data mining in functional debug. ICCAD (2014)
Li-C. Wang, Magdy S. Abadir
Data Mining In EDA - Basic Principles, Promises, and Constraints. DAC (2014)
Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
Yield optimization using advanced statistical correlation methods. ITC (2014)
Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
Multivariate outlier modeling for capturing customer returns - How simple it can be. IOLTS (2014)
Vinayak Kamath, Farhan Rahman, Li-C. Wang
Analyzing Efficacy of Constrained Test Program Generators - A Case Study. MTV (2013)
Li-C. Wang
Data mining in design and test processes: basic principles and promises. ISPD (2013)
Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
A pattern mining framework for inter-wafer abnormality analysis. ITC (2013)
Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir
Novel test analysis to improve structural coverage - A commercial experiment. VLSI-DAT (2013)
Sandip Ray, Jay Bhadra, Magdy S. Abadir, Li-C. Wang
Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs. J. Electron. Test. 29 (5) (2013)
Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir
Simulation knowledge extraction and reuse in constrained random processor verification. DAC (2013)
Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang
Data mining based prediction paradigm and its applications in design automation. VLSI-DAT (2012)
An-Yeu Wu, Li-C. Wang
Foreword. VLSI-DAT (2012)
Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
Functional test content optimization for peak-power validation - An experimental study. ITC (2012)
Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Aarti Gupta
Introduction to special section on verification challenges in the concurrent world. ACM Trans. Design Autom. Electr. Syst. 17 (3) (2012)
Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Screening customer returns with multivariate test analysis. ITC (2012)
Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
An experiment of burn-in time reduction based on parametric test analysis. ITC (2012)
Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir
Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD (2012)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Understanding customer returns from a test perspective. VTS (2011)
Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
Forward prediction based on wafer sort data - A case study. ITC (2011)
Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE (2011)
Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja
Mining AC delay measurements for understanding speed-limiting paths. ITC (2010)
Sean H. Wu, Sreejit Chakravarty, Li-C. Wang
Impact of multiple input switching on delay test under process variation. VTS (2010)
Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang
Online selection of effective functional test programs based on novelty detection. ICCAD (2010)
Po-Hsien Chang, Li-C. Wang
Automatic assertion extraction via sequential data mining of simulation traces. ASP-DAC (2010)
Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch. IEEE Des. Test Comput. 27 (3) (2010)
Po-Hsien Chang, Li-C. Wang, Jayanta Bhadra
A kernel-based approach for functional test program generation. ITC (2010)
Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang
On evaluating speed path detection of structural tests. ISQED (2010)
Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja
Correlating system test Fmax with structural test Fmax and process monitoring measurements. ASP-DAC (2010)
Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja
Selecting the most relevant structural Fmax for system Fmax correlation. VTS (2010)
Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang
A new sampling method for analog behavioral modeling. ISCAS (2010)
Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang
Analog behavioral modeling flow using statistical learning method. ISQED (2010)
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang
A non-parametric approach to behavioral device modeling. ISQED (2010)
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster
Increasing the Efficiency of Simulation-Based Functional Verification Through Unsupervised Support Vector Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (1) (2010)
Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. DAC (2010)
Li-C. Wang
Data learning based diagnosis. ASP-DAC (2010)
Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir
Minimizing outlier delay test cost in the presence of systematic variability. ITC (2009)
Nicholas Callegari, Li-C. Wang, Pouria Bastani
Feature based similarity search with application to speedpath analysis. ITC (2009)
Li-C. Wang
Data Learning Techniques for Functional/System Fmax Prediction. DFT (2009)
Nicholas Callegari, Li-C. Wang, Pouria Bastani
Speedpath analysis based on hypothesis pruning and ranking. DAC (2009)
Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja
Data learning techniques and methodology for Fmax prediction. ITC (2009)
Nicholas Callegari, Pouria Bastani, Li-C. Wang, Sreejit Chakravarty, Alexander Tetelbaum
Path selection for monitoring unexpected systematic timing effects. ASP-DAC (2009)
Nicholas Callegari, Pouria Bastani, Li-C. Wang, Magdy S. Abadir
A Statistical Diagnosis Approach for Analyzing Design-Silicon Timing Mismatch. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (11) (2009)
Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang
Predicting variability in nanoscale lithography processes. DAC (2009)
Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. ITC (2008)
Pouria Bastani, Kip Killpack, Li-C. Wang, Eli Chiprout
Speedpath prediction based on learning from a small set of examples. DAC (2008)
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster
Functional test selection based on unsupervised support vector analysis. DAC (2008)
Sean H. Wu, Sreejit Chakravarty, Alexander Tetelbaum, Li-C. Wang
Refining Delay Test Methodology Using Knowledge of Asymmetric Transition Delay. ATS (2008)
Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
Statistical diagnosis of unmodeled systematic timing effects. DAC (2008)
Pouria Bastani, Li-C. Wang, Magdy S. Abadir
Linking Statistical Learning to Diagnosis. IEEE Des. Test Comput. 25 (3) (2008)
Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang
A Clock-Less Jitter Spectral Analysis Technique. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2008)
Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang
A Study of Outlier Analysis Techniques for Delay Testing. ITC (2008)
Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Sandip Ray
A Survey of Hybrid Techniques for Functional Verification. IEEE Des. Test Comput. 24 (2) (2007)
Onur Guzey, Li-C. Wang, Jayanta Bhadra
Enhancing signal controllability in functional test-benches through automatic constraint extraction. ITC (2007)
Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
Statistical analysis and optimization of parametric delay test. ITC (2007)
Charles H.-P. Wen, Li-C. Wang, Jayanta Bhadra
An incremental learning framework for estimating signal controllability in unit-level verification. ICCAD (2007)
Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir
Analyzing the risk of timing modeling based on path delay tests. ITC (2007)
Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang
Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques. IEEE Des. Test Comput. 24 (2) (2007)
Onur Guzey, Li-C. Wang
Coverage-directed test generation through automatic constraint extraction. HLDVT (2007)
Li-C. Wang, Pouria Bastani, Magdy S. Abadir
Design-Silicon Timing Correlation A Data Mining Perspective. DAC (2007)
Onur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Hillel Miller, Magdy S. Abadir
Extracting a Simplified View of Design Functionality Based on Vector Simulation. Haifa Verification Conference (2006)
Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng
Simulation-Based Functional Test Generation for Embedded Processors. IEEE Trans. Computers 55 (11) (2006)
Charles H.-P. Wen, Onur Guzey, Li-C. Wang
Simulation-based functional test justification using a decision-digram-based Boolean data miner. ICCD (2006)
Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
Refined statistical static timing analysis through. DAC (2006)
Leonard Lee, Li-C. Wang
An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space. ITC (2006)

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Publication Activity (10 Years)

Top Topics

Top Venues

Li-C. Wang