Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs.
Sandip RayJay BhadraMagdy S. AbadirLi-C. WangPublished in: J. Electron. Test. (2013)
Keyphrases
- test generation
- lessons learned
- hardware software co design
- real world
- long term
- hardware and software
- paradigm shift
- open issues
- computing power
- technical challenges
- special issue
- promising directions
- asynchronous circuits
- future trends
- advanced technologies
- neural network
- application specific integrated circuits
- personal computer
- model checking
- test cases
- website
- information systems
- artificial intelligence
- information retrieval