Consistency in wafer based outlier screening.
Sebastian SiatkowskiChuanhe Jay ShanLi-C. WangNikolas SumikawaW. Robert DaaschJohn M. CarulliPublished in: VTS (2016)
Keyphrases
- outlier detection
- integrated circuit
- semiconductor manufacturing
- consistency checking
- novelty detection
- image analysis
- wafer fabrication
- computer vision
- global consistency
- massively parallel
- case study
- constraint networks
- search space
- artificial neural networks
- drug discovery
- search algorithm
- website
- decision making