Chuanhe Jay Shan

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 11

Top Topics

Defect Detection

Consistency Checking

Top Venues

Publications

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan
MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. ITC (2021)
Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
Learning A Wafer Feature With One Training Sample. ITC (2020)
Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
Deploying A Machine Learning Solution As A Surrogate. ITC (2019)
Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba
Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. ICCAD (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia (2019)
Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT (2019)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Concept Recognition in Production Yield Data Analytics. ITC (2018)
Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
Discovering Interesting Plots in Production Yield Data Analytics. CoRR (2018)
Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC (2017)
Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
Some considerations on choosing an outlier method for automotive product lines. ITC (2017)
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
Consistency in wafer based outlier screening. VTS (2016)