Wafer Plot Classification Using Neural Networks and Tensor Methods.
Ahmed WahbaChuanhe Jay ShanLi-C. WangNik SumikawaPublished in: ITC-Asia (2019)
Keyphrases
- neural network
- pattern recognition
- machine learning methods
- neural networks and support vector machines
- classification method
- benchmark datasets
- preprocessing
- classification systems
- cross validation
- image classification
- benchmark data sets
- machine learning algorithms
- multi class
- significant improvement
- rule extraction
- feature selection
- principal component analysis
- supervised learning
- fuzzy logic
- classification accuracy
- pattern classification
- artificial neural networks
- training set
- multiclass classification
- fuzzy decision trees