Learning A Wafer Feature With One Training Sample.

Yueling Jenny Zeng Li-C. Wang Chuanhe Jay Shan Nik Sumikawa

Published in: ITC (2020)

Keyphrases

learning algorithm
learning process
training samples
high quality
reinforcement learning
supervised learning
training examples
data mining
computer vision
image processing
feature extraction
small number
unsupervised learning
test data
semiconductor manufacturing