W. Robert Daasch

Publication Activity (10 Years)

Years Active: 1987-2016
Publications (10 Years): 3

Top Topics

Statistical Model

Wafer Fabrication

Novelty Detection

Top Venues

IEEE Trans. Computers

Publications

Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
Consistency in wafer based outlier screening. VTS (2016)
Kenneth M. Butler, Amit Nahar, W. Robert Daasch
What we know after twelve years developing and deploying test data analytics solutions. ITC (2016)
Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch
Generalization of an outlier model into a "global" perspective. ITC (2015)
C. Glenn Shirley, W. Robert Daasch
Copula Models of Correlation: A DRAM Case Study. IEEE Trans. Computers 63 (10) (2014)
C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy
Board manufacturing test correlation to IC manufacturing test. ITC (2014)
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
Die-level adaptive test: Real-time test reordering and elimination. ITC (2011)
W. Robert Daasch, C. Glenn Shirley, Amit Nahar
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26 (5) (2009)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26 (5) (2009)
Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC (2009)
Saurabh Jain, W. Robert Daasch, David Armbrust
Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT (2008)
Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke
Silicon evaluation of longest path avoidance testing for small delay defects. ITC (2007)
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23 (2) (2006)
W. Robert Daasch, Robert Madge
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC (2005)
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch
The value of statistical testing for quality, yield and test cost improvement. ITC (2005)
Amit Nahar, W. Robert Daasch, Suresh Subramaniam
Burn-in reduction using principal component analysis. ITC (2005)
W. Robert Daasch, Robert Madge
Data-driven models for statistical testing: measurements, estimates and residuals. ITC (2005)
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
Defect Screening Using Independent Component Analysis on I_DDQ. VTS (2005)
Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic
A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) (2004)
W. Robert Daasch, Manu Rehani
Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC (2004)
Chris Schuermyer, Jens Ruffler, W. Robert Daasch
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC (2004)
Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware
Detection of Temperature Sensitive Defects Using ZTC. VTS (2004)
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC (2004)
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS (2003)
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC (2003)
Robert Madge, Brady Benware, W. Robert Daasch
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20 (5) (2003)
Chee How Lim, W. Robert Daasch, George Cai
A Thermal-Aware Superscalar Microprocessor (invited). ISQED (2002)
David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
Isolating and Removing Sources of Variation in Test Data. ITC (2002)
Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS (2002)
Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC (2002)
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19 (5) (2002)
Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19 (5) (2002)
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC (2002)
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC (2001)
W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota
Variance reduction using wafer patterns in I_ddQ data. ITC (2000)
Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch
EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS (2000)
Michael A. Driscoll, W. Robert Daasch
Accurate Predictions of Parallel Program Execution Time. J. Parallel Distributed Comput. 25 (1) (1995)
Pan Wu, Rolf Schaumann, W. Robert Daasch
A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS (1993)
W. Robert Daasch, Martine Wedlake, Rolf Schaumann, Pan Wu
Automation of the ic layout of continuous-time transconductance-capacitor filters. Int. J. Circuit Theory Appl. 20 (3) (1992)
William A. Payne III, Fillia Makedon, W. Robert Daasch
High Speed Interconnection Using the Clos Network. ICS (1987)