Ali Keshavarzi

Publication Activity (10 Years)

Years Active: 1997-2024
Publications (10 Years): 8

Top Topics

Image Statistics

Natural Environment

Intelligent Systems

Top Venues

Comput. Electron. Agric.

Publications

Ali Keshavarzi, Elsa Angelini
Few-Shot Airway-Tree Modeling using Data-Driven Sparse Priors. CoRR (2024)
Sunshine A. De Caires, Ali Keshavarzi, Eduardo Leonel Bottega, Fuat Kaya
Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factors. Comput. Electron. Agric. 216 (2024)
Ali Keshavarzi, Henry Oppong Tuffour, Jimmy Clifford Oppong, Mojtaba Zeraatpisheh, Vinod Kumar
Dealing with soil organic carbon modeling: some insights from an agro-ecosystem in Northeast Iran. Earth Sci. Informatics 14 (4) (2021)
Ali Keshavarzi, Kai Ni, Wilbert van den Hoek, Suman Datta, Arijit Raychowdhury
FerroElectronics for Edge Intelligence. IEEE Micro 40 (6) (2020)
Ali Keshavarzi, Wilbert van den Hoek
Edge Intelligence - On the Challenging Road to a Trillion Smart Connected IoT Devices. IEEE Des. Test 36 (2) (2019)
Jesús Rodrigo-Comino, Ali Keshavarzi, Mojtaba Zeraatpisheh, Yeboah Gyasi-Agyei, Artemi Cerdà
Determining the best ISUM (Improved stock unearthing Method) sampling point number to model long-term soil transport and micro-topographical changes in vineyards. Comput. Electron. Agric. 159 (2019)
Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Ursula Iturrarán-Viveros, Ali Bagherzadeh, Rouhollah Mousavi, Sepideh Karimi
Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic models. Comput. Electron. Agric. 135 (2017)
Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Sepideh Karimi
Using soil easily measured parameters for estimating soil water capacity: Soft computing approaches. Comput. Electron. Agric. 141 (2017)
Ali Keshavarzi, Dinesh Maheshwari, Derwin Mattos, Ravi Kapre, Sandeep Krishnegowda, Morgan Whately, Sudhir Gopalswamy
Directions in future of SRAM with QDR-WideIO for high performance networking applications and beyond. CICC (2014)
Shekhar Borkar, Uming Ko, Ali Keshavarzi, Eugenio Cantatore
EP3: Empowering the killer SoC applications of 2020. ISSCC (2013)
Ali Keshavarzi, Fereydoon Sarmadian, Reza Labbafi, Abbas Ahmadi
Developing Pedotransfer Functions for Estimating Field Capacity and Permanent Wilting Point Using Fuzzy Table Look-up Scheme. Comput. Inf. Sci. 4 (1) (2011)
Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Borkar, Vivek K. De, Ali Keshavarzi
2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology. IEEE J. Solid State Circuits 44 (1) (2009)
Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Y. Borkar, Vivek De, Ali Keshavarzi
2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic Process. ISSCC (2008)
José Luis Rosselló, Vicent Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs CoRR (2007)
Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura
Impact of Thermal Gradients on Clock Skew and Testing. IEEE Des. Test Comput. 23 (5) (2006)
Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay
Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design (2005)
James W. Tschanz, Siva G. Narendra, Ali Keshavarzi, Vivek De
Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. ISCAS (1) (2005)
José Luis Rosselló, Vicent Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE (2005)
Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De
Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. ISLPED (2005)
Arman Vassighi, Ali Keshavarzi, Siva G. Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De
Design optimizations for microprocessors at low temperature. DAC (2004)
Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
DFT for Delay Fault Testing of High-Performance Digital Circuits. IEEE Des. Test Comput. 21 (3) (2004)
Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC (2004)
Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC (2004)
Shekhar Borkar, Tanay Karnik, Siva G. Narendra, James W. Tschanz, Ali Keshavarzi, Vivek De
Parameter variations and impact on circuits and microarchitecture. DAC (2003)
Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT (2003)
Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura
CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC (2003)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De
. IEEE Trans. Very Large Scale Integr. Syst. 11 (5) (2003)
Charles F. Hawkins, Ali Keshavarzi, Jaume Segura
CMOS IC nanometer technology failure mechanisms. CICC (2003)
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Thermal Management of High Performance Microprocessors. DFT (2003)
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC (2003)
Siva G. Narendra, Ali Keshavarzi, Bradley A. Bloechel, Shekhar Borkar, Vivek De
Forward body bias for microprocessors in 130-nm technology generation and beyond. IEEE J. Solid State Circuits 38 (5) (2003)
Fatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva G. Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De
SRAM cells with full-swing single-ended bit line sensing for on-chip cache. IEEE Trans. Very Large Scale Integr. Syst. 10 (2) (2002)
Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy
IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions. IEEE Des. Test Comput. 19 (2) (2002)
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT (2002)
Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC (2002)
Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19 (5) (2002)
Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy
IDDQ Testing for Deep Submicron ICs: Challenges and Solutions. LATW (2002)
Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi
A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ITC (2002)
Jaume Segura, Vivek De, Ali Keshavarzi
Challenges in Nanometric Technology Scaling: Trends and Projections. VTS (2002)
Kaushik Roy, Ali Keshavarzi
Design and Test of Low Voltage CMOS Circuits. ISQED (2001)
Ali Keshavarzi, Sean Ma, Siva G. Narendra, Brad Bloechel, K. Mistry, Tahir Ghani, Shekhar Borkar, Vivek De
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs. ISLPED (2001)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8 (6) (2000)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC (2000)
Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED (1999)
Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC (1997)