Bartomeu Alorda

Publication Activity (10 Years)

Years Active: 2000-2024
Publications (10 Years): 15

Top Topics

Energy Consumption

Top Venues

Intelligent Environments (Workshops)

Microelectron. Reliab.

Publications

Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, Sebastia Bota, Jaume Segura
SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results. CoRR (2024)
Abdel Alheyasat, Gabriel Torrens, Sebastia Bota, Bartomeu Alorda
SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications. DCIS (2022)
Andreu Moià-Pol, Pere Rullan, Bartomeu Alorda
Intelligent Thermal Storage in the Balearic Islands Hotels with Solar Energy. Intelligent Environments (Workshops) (2020)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric. DCIS (2020)
Cristian Carmona, Juan Muñoz, Bartomeu Alorda
New Approach to Indoor Thermal Climate Control Using Natural Building Envelope and Cross Ventilation Techniques. Intelligent Environments (Workshops) (2020)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Bit-Cell Selection Analysis for Embedded SRAM-Based PUF. ISCAS (2020)
Bartomeu Alorda, Cristian Carmona, Juan Munoz, Francesc Masdeu, Gabriel Horrach
Overheating Mitigation Strategies Analysis: A Mediterranean Case Study. Intelligent Environments (Workshops) (2019)
Andreu Moià-Pol, Pere Rullan, Bartomeu Alorda
Intelligent Energy Consumption in the Balearic Islands Hotels. Intelligent Environments (Workshops) (2019)
Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià A. Bota
A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors. IEEE Trans. Emerg. Top. Comput. 7 (3) (2019)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Weak and Strong SRAM cells analysis in embedded memories for PUF applications. DCIS (2019)
Bartomeu Alorda, Gabriel Torrens
Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift. DTIS (2017)
Sebastià A. Bota, Jaume Verd, Joan Barceló, Xavier Gili, Bartomeu Alorda, Gabriel Torrens, Carol de Benito, Jaume Segura
Cantilever NEMS relay-based SRAM devices for enhanced reliability. DTIS (2017)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota
6T CMOS SRAMs reliability monitoring through stability measurements. IOLTS (2017)
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
On-line write margin estimator to monitor performance degradation in SRAM cores. IOLTS (2016)
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies. Microelectron. Reliab. 65 (2016)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells. Microelectron. Reliab. 54 (11) (2014)
Cristian Carmona, Bartomeu Alorda, Miquel A. Ribot
Energy consumption savings in ZigBee-based WSN adjusting power transmission at application layer. PATMOS (2014)
Bartomeu Alorda, Cristian Carmona, Sebastià A. Bota
Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications. DATE (2014)
Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura
Accurate alpha soft error rate evaluation in SRAM memories. IOLTS (2013)
Guillermo Rodríguez-Navas, Miquel A. Ribot, Bartomeu Alorda
Understanding the Role of Transmission Power in Component-Based Architectures for Adaptive WSN. COMPSAC Workshops (2012)
Bartomeu Alorda, Jaume Verd, Vincent Canals, Kay Suenaga, V. Martinez
Multi-subject Project Based Learning initiative. EDUCON (2012)
Bartomeu Alorda, Kay Suenaga, Pere Pons
Design and evaluation of a microprocessor course combining three cooperative methods: SDLA, PjBL and CnBL. Comput. Educ. 57 (3) (2011)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
8T vs. 6T SRAM cell radiation robustness: A comparative analysis. Microelectron. Reliab. 51 (2) (2011)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation. DATE (2011)
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. IOLTS (2010)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs. DATE (2010)
Gabriel Torrens, Bartomeu Alorda, Salvador Barcelo, José Luis Rosselló, Sebastià A. Bota, Jaume Segura
Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination. IEEE Trans. Circuits Syst. II Express Briefs (4) (2010)
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda
Critical charge characterization in 6-T SRAMs during read mode. IOLTS (2009)
Bartomeu Alorda, Ivan de Paúl, Jaume Segura
Charge-based testing BIST for embedded memories. IET Comput. Digit. Tech. 1 (5) (2007)
Bartomeu Alorda, Sebastià A. Bota, Jaume Segura
A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits. IOLTS (2005)
Bartomeu Alorda, Vincent Canals, Jaume Segura
A Two-Level Power-Grid Model for Transient Current Testing Evaluation. J. Electron. Test. 20 (5) (2004)
Bartomeu Alorda, Vicent Canals, Ivan de Paúl, Jaume Segura
A BIST-based Charge Analysis for Embedded Memories. IOLTS (2004)
Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura
CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC (2003)
Bartomeu Alorda, Jaume Segura
An Evaluation of Built-in vs. Off-chip Strategies for On-line Transient Current Testing. IOLTS (2003)
Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC (2002)
Bartomeu Alorda, André Ivanov, Jaume Segura
An Off-Chip Sensor Circuit for On-Line Transient Current Testing. IOLTW (2002)
Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS (2001)
Bartomeu Alorda, Ivan de Paúl, Jaume Segura, T. Miller
On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. IOLTW (2000)