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CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.
Bartomeu Alorda
Brad Bloechel
Ali Keshavarzi
Jaume Segura
Published in:
ITC (2003)
Keyphrases
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real time
high speed
high density
user interface
test cases
steady state
user friendly
circuit design
monitoring system
production system
lot size
programmable logic
mixed signal
phase locked loop