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CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.

Bartomeu AlordaBrad BloechelAli KeshavarziJaume Segura
Published in: ITC (2003)
Keyphrases
  • real time
  • high speed
  • high density
  • user interface
  • test cases
  • steady state
  • user friendly
  • circuit design
  • monitoring system
  • production system
  • lot size
  • programmable logic
  • mixed signal
  • phase locked loop