Gabriel Torrens

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 14

Top Topics

Variance Estimator

Spatially Adaptive

Top Venues

Microelectron. Reliab.

Publications

Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, Sebastia Bota, Jaume Segura
SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results. CoRR (2024)
Sebastià A. Bota, Salvador Barcelo, Gabriel Torrens, Rafel Perelló, Jaume Verd, Ivan de Paúl, Jaume Segura
A Compact Double-Exponential Circuit for Single Event Transient Emulation. DCIS (2023)
Abdel Alheyasat, Gabriel Torrens, Sebastia Bota, Bartomeu Alorda
SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications. DCIS (2022)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric. DCIS (2020)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Bit-Cell Selection Analysis for Embedded SRAM-Based PUF. ISCAS (2020)
Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià A. Bota
A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors. IEEE Trans. Emerg. Top. Comput. 7 (3) (2019)
A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
Weak and Strong SRAM cells analysis in embedded memories for PUF applications. DCIS (2019)
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Gabriel Torrens, Sebastià A. Bota, Jaume Segura, Francesc Moll, Antonio Rubio
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells. SMACD (2017)
Bartomeu Alorda, Gabriel Torrens
Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift. DTIS (2017)
Sebastià A. Bota, Jaume Verd, Joan Barceló, Xavier Gili, Bartomeu Alorda, Gabriel Torrens, Carol de Benito, Jaume Segura
Cantilever NEMS relay-based SRAM devices for enhanced reliability. DTIS (2017)
Daniel Malagón, Sebastià A. Bota, Gabriel Torrens, Xavier Gili, Javier Praena, B. Fernández, Miguel Macías, Jose Manuel Quesada Molina, Carlos Guerrero Sanchez, María del Carmen Jiménez-Ramos, Javier García López, José Luis Merino, Jaume Segura
Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources. Microelectron. Reliab. 78 (2017)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota
6T CMOS SRAMs reliability monitoring through stability measurements. IOLTS (2017)
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
On-line write margin estimator to monitor performance degradation in SRAM cores. IOLTS (2016)
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies. Microelectron. Reliab. 65 (2016)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells. Microelectron. Reliab. 54 (11) (2014)
Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura
Accurate alpha soft error rate evaluation in SRAM memories. IOLTS (2013)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
8T vs. 6T SRAM cell radiation robustness: A comparative analysis. Microelectron. Reliab. 51 (2) (2011)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation. DATE (2011)
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. IOLTS (2010)
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs. DATE (2010)
Gabriel Torrens, Bartomeu Alorda, Salvador Barcelo, José Luis Rosselló, Sebastià A. Bota, Jaume Segura
Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination. IEEE Trans. Circuits Syst. II Express Briefs (4) (2010)
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda
Critical charge characterization in 6-T SRAMs during read mode. IOLTS (2009)