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Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources.

Daniel MalagónSebastià A. BotaGabriel TorrensXavier GiliJavier PraenaB. FernándezMiguel MacíasJose Manuel Quesada MolinaCarlos Guerrero SanchezMaría del Carmen Jiménez-RamosJavier García LópezJosé Luis MerinoJaume Segura
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • lower error rates
  • equal error rate
  • power consumption
  • monte carlo simulation
  • machine learning
  • feature extraction
  • training error
  • false discovery rate
  • rejection rate