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A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.

Bartomeu AlordaSebastià A. BotaJaume Segura
Published in: IOLTS (2005)
Keyphrases
  • vlsi circuits
  • mixed signal
  • sensor networks
  • low power
  • real time
  • sensor data
  • computer vision
  • test cases
  • steady state