Jerry M. Soden

Publication Activity (10 Years)

Years Active: 1985-2002
Publications (10 Years): 0

Publications

Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC (2002)
Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC (2002)
Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS (2001)
Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. 16 (4) (1999)
Charles F. Hawkins, Jerry M. Soden
Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. 16 (4) (1999)
Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
CMOS IC reliability indicators and burn-in economics. ITC (1998)
Jerry M. Soden, Christopher L. Henderson
Still in the Stone Age? IEEE Des. Test Comput. 14 (3) (1997)
Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
IC Failure Analysis: Magic, Mystery, and Science. IEEE Des. Test Comput. 14 (3) (1997)
Jerry M. Soden, Christopher L. Henderson
IC Diagnosis: Industry Issues. ITC (1997)
Christopher L. Henderson, Jerry M. Soden
Signature Analysis for IC Diagnosis and Failure Analysis. ITC (1997)
Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
) Analysis for Detecting IC Defects. ITC (1997)
Alan W. Righter, Jerry M. Soden, Richard W. Beegle
Characterization and Testing - Practical Issues. ITC (1996)
Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. ITC (1996)
Jerry M. Soden, Charles F. Hawkins
IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. 13 (4) (1996)
Charles F. Hawkins, Jerry M. Soden
IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. 12 (2) (1995)
Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
Defect Classes - An Overdue Paradigm for CMOS IC. ITC (1994)
Jerry M. Soden, Richard E. Anderson
IC failure analysis: techniques and tools for quality reliability improvement. Proc. IEEE 81 (5) (1993)
Jerry M. Soden, Charles F. Hawkins
Quality Testing Requires Quality Thinking. ITC (1993)
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
IDDQ testing: A review. J. Electron. Test. 3 (4) (1992)
Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC (1991)
Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins
test sets. ITC (1990)
Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins
. ITC (1990)
Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC (1989)
Jerry M. Soden, Charles F. Hawkins
Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test 3 (4) (1986)
Jerry M. Soden, Charles F. Hawkins
Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC (1986)
Jerry M. Soden, Charles F. Hawkins
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC (1985)