Test and Reliability: Partners in IC Manufacturing, Part 2.
Charles F. HawkinsJaume SeguraJerry M. SodenTed DellinPublished in: IEEE Des. Test Comput. (1999)
Keyphrases
- integrated circuit
- website
- manufacturing processes
- database
- data sets
- data mining
- cooperative
- manufacturing environment
- operations management
- manufacturing industry
- manufacturing process
- production planning
- manufacturing systems
- test data
- multi agent systems
- multiscale
- database systems
- decision trees
- artificial intelligence
- neural network
- real time