MANUFACTURING ENVIRONMENT
Experts
- Hesuan Hu
- MengChu Zhou
- Zhiwu Li
- Keyi Xing
- Yang Liu
- Fei Tao
- Lin Zhang
- Naiqi Wu
- Damien Trentesaux
- Reza Tavakkoli-Moghaddam
- Paulo Leitão
- Kira Barton
- Lyès Benyoucef
- Dawn M. Tilbury
- Yihai He
- Xiaolan Xie
- Andrea Matta
- Jose L. Martinez Lastra
- Birgit Vogel-Heuser
- Chen Chen
- Yan Yang
- Alexandre Dolgui
- Jingshan Li
- Maria Pia Fanti
- Weiming Shen
- Frank DiCesare
- Andrew Y. C. Nee
- Xun Xu
- Marco Taisch
- Yongkui Liu
- Nan Du
- Ershun Pan
- Jean-Pierre Kenné
- Michael Weyrich
- Ilya Kovalenko
- MuDer Jeng
- Andrew Kusiak
- John W. Fowler
- Francesco Martinelli
Venues
- WSC
- Int. J. Comput. Integr. Manuf.
- J. Intell. Manuf.
- Comput. Ind. Eng.
- Int. J. Prod. Res.
- ICRA
- CASE
- CoRR
- IEEE Access
- ETFA
- Eur. J. Oper. Res.
- SMC
- Comput. Ind.
- Int. J. Manuf. Technol. Manag.
- IEEE Trans Autom. Sci. Eng.
- APMS (2)
- SOHOMA
- IEEE Trans. Autom. Control.
- ACC
- APMS (1)
- Sensors
- IEEM
- IEEE Trans. Syst. Man Cybern. Syst.
- Reliab. Eng. Syst. Saf.
- Robotics Comput. Integr. Manuf.
- APMS
- Expert Syst. Appl.
- INDIN
- Ind. Manag. Data Syst.
- Oper. Res.
- IEEE Trans. Robotics Autom.
- IEEE Trans. Ind. Informatics
- Int. J. Autom. Technol.
- BASYS
- Int. J. Manuf. Res.
- Ann. Oper. Res.
- Autom.
- J. Oper. Res. Soc.
- IECON
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