MuDer Jeng

Publication Activity (10 Years)

Years Active: 1993-2013
Publications (10 Years): 0

Top Topics

Linear Programming Problems

Manufacturing Systems

Top Venues

Publications

Yi-Sheng Huang, Yi-Shun Weng, MuDer Jeng, Bo-Yang Chen
Based on Synchronized Timed Petri Nets for Urban Traffic Control Systems. SMC (2013)
Yen-Liang Pan, Hesuan Hu, MuDer Jeng
One computationally improved deadlock prevention policy for flexible manufacturing systems using Petri nets. CASE (2013)
Yen-Liang Pan, Yi-Sheng Huang, Yi-Shun Weng, Weimin Wu, MuDer Jeng
Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems. J. Appl. Math. 2013 (2013)
Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng, Sheng-Luen Chung
Using theory of regions with selective siphon control for deadlock prevention policy in Petri nets. SMC (2012)
Chuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng
Wafer defect inspection by neural analysis of region features. J. Intell. Manuf. 22 (6) (2011)
Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng
An efficient deadlock prevention policy for FMSs using reduction method and theory of regions. SMC (2011)
Po-Lun Chang, Yu-Xin Guo, MuDer Jeng
Telematics gateway and power saving method for electric vehicles. SMC (2011)
ChunHsi Li, Chuan-Yu Chang, MuDer Jeng
Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection. IEEE Trans. Syst. Man Cybern. Part C 41 (6) (2011)
Yi-Sheng Huang, Ho-Shan Chiang, MuDer Jeng
Fault measure of discrete event systems using probabilistic timed automata. SMC (2011)
Yi-Sheng Huang, Yen-Liang Pan, MuDer Jeng, Po-Lun Chang
Enhancement of an deadlock prevention policy for FMSs using theory of regions. SMC (2010)
Yi-Sheng Huang, Shuo-Xian Liau, MuDer Jeng
Modeling and analysis of traffic light controller using Statechart. SMC (2010)
ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng
A case study of applying regional level-set formulation to post-sawing LED wafer inspection. SMC (2010)
Yi-Sheng Huang, MuDer Jeng
An Enforcing Supervisor for Flexible Manufacturing Systems Using Theory of Regions. SMC (2009)
Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng
Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. IEEE Trans. Syst. Man Cybern. Part C 39 (3) (2009)
Po-Lun Chang, Ying-Kuei Yang, Wei-Lieh Hsu, Fei-Hu Hsieh, MuDer Jeng, Yu-Xin Guo
A Novel Consumer Clock Device Based on Grey Relational Analysis. SMC (2009)
Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng
An unsupervised neural network approach for automatic semiconductor wafer defect inspection. Expert Syst. Appl. 36 (1) (2009)
Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng
Automatic Die Inspection for Post-sawing LED Wafers. SMC (2009)
YuanLin Wen, MuDer Jeng
Diagnosable discrete event system design: A case study of automatic temperature control system. SMC (2008)
ZhiWu Li, MengChu Zhou, MuDer Jeng
A Maximally Permissive Deadlock Prevention Policy for FMS Based on Petri Net Siphon Control and the Theory of Regions. IEEE Trans Autom. Sci. Eng. 5 (1) (2008)
YuanLin Wen, Sheng-Luen Chung, Li-Der Jeng, MuDer Jeng
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. KES (2) (2007)
Chii-Ruey Lin, Pei-Shu Fan, Yea-Jou Shiau, MuDer Jeng
An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process. KES (2) (2007)
MuDer Jeng, MengChu Zhou
Guest Editorial Special Issue on Engineering Applications of Petri Nets. IEEE Trans. Syst. Man Cybern. Part C 37 (4) (2007)
Da-Yin Liao, MuDer Jeng, MengChu Zhou
Application of Petri Nets and Lagrangian Relaxation to Scheduling Automatic Material-Handling Vehicles in 300-mm Semiconductor Manufacturing. IEEE Trans. Syst. Man Cybern. Part C 37 (4) (2007)
YuanLin Wen, Pei-Shu Fan, MuDer Jeng
Diagnosable discrete event systems design. SMC (2007)
YuanLin Wen, ChunHsi Li, MuDer Jeng
Diagnosability Enhancement of Discrete Event Systems. SMC (2006)
YuanLin Wen, MuDer Jeng, Li-Der Jeng, Pei-Shu Fan
An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems. KES (2) (2006)
YuanLin Wen, ChunHsi Li, MuDer Jeng
A polynomial algorithm for checking diagnosability of Petri nets. SMC (2005)
Chang-Pin Lin, Li-Der Jeng, Yi-Ping Lin, MuDer Jeng
Management and control of information flow in CIM systems using UML and Petri nets. Int. J. Comput. Integr. Manuf. 18 (2&3) (2005)
Chung-Hsien Kuo, Han-Pang Huang, MuDer Jeng, Li-Der Jeng
Separation model design of manufacturing systems using the distributed agent-oriented Petri net. Int. J. Comput. Integr. Manuf. 18 (2&3) (2005)
Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. CASE (2005)
Chung-Hsien Kuo, Jein-Jong Wing, Eric Lee, MuDer Jeng
Development of route oriented Petri net for cycle time evaluations in SMT assemblies industries. SMC (2005)
Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng
An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. ICRA (2005)
MuDer Jeng, Xiaolan Xie
Discrete event system techniques for CIM: guest editorial. Int. J. Comput. Integr. Manuf. 18 (2&3) (2005)
MuDer Jeng
Comments on "Timed Petri Nets in Modeling and Analysis of Cluster Tools". IEEE Trans Autom. Sci. Eng. 2 (1) (2005)
Sheng-Luen Chung, MuDer Jeng
Scenario normalization techniques - inline stepper coordinator design. IEEE Robotics Autom. Mag. 11 (3) (2004)
Sheng-Luen Chung, MuDer Jeng
Fabulous MESs and C/Cs: an overview of semiconductor fab automation systems. IEEE Robotics Autom. Mag. 11 (1) (2004)
Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng
Using a self-organizing neural network for wafer defect inspection. SMC (5) (2004)
MuDer Jeng, Mengchu Zhou, Thomas Wen-Yao Chen
Recent advances in semiconductor factory automation, part 2: equipment-level automation. IEEE Robotics Autom. Mag. 11 (3) (2004)
MuDer Jeng, Mengchu Zhou, Thomas Wen-Yao Chen
Special issue on semiconductor factory automation. 1. System-level automation (From the guest editors). IEEE Robotics Autom. Mag. 11 (1) (2004)
Da-Yin Liao, MuDer Jeng, MengChu Zhou
Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing. ICRA (2004)
YuanLin Wen, MuDer Jeng
Diagnosability of Petri nets. SMC (5) (2004)
MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. IEEE Trans. Syst. Man Cybern. Part A 34 (1) (2004)
MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
ERCN merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. ICRA (2003)
Sheng-Luen Chung, Chien-Chung Wu, MuDer Jeng
Failure diagnosis: a case study on modeling and analysis by Petri nets. SMC (2003)
Yi-Sheng Huang, Sheng-Luen Chung, MuDer Jeng, Jenn-Huei Lin
Design and implementation of a discrete event system using statecharts. SMC (2003)
Sheng-Luen Chung, MuDer Jeng
AN overview of semiconductor fab automation systems. ICRA (2003)
MuDer Jeng, Xiaolan Xie, Mao Yu Peng
Process nets with resources for manufacturing modeling and their analysis. IEEE Trans. Robotics Autom. 18 (6) (2002)
Yi-Sheng Huang, MuDer Jeng, YuanLin Wen
Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems. ICRA (2002)
MuDer Jeng, Weizhao Lu
Extension of UML and Its Conversion to Petri Nets for Semiconductor Manufacturing Modeling. ICRA (2002)
Sheng-Luen Chung, MuDer Jeng
Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study. ICRA (2002)
MuDer Jeng, Xiaolan Xie
Guest editorial. IEEE Trans. Robotics Autom. 17 (5) (2001)
Yi-Sheng Huang, MuDer Jeng, Sheng-Luen Chung
Design, analysis and implementation of a real-world manufacturing cell controller based on Petri nets. Int. J. Comput. Integr. Manuf. 14 (3) (2001)
MuDer Jeng, Xiaolan Xie
Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. IEEE Trans. Robotics Autom. 17 (5) (2001)
MuDer Jeng, Xiaolan Xie
Modeling and Analysis of Semiconductor Manufacturing Systems with Degraded Behaviors Using Petri Nets and Siphons. ICRA (2001)
Yi-Sheng Huang, MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung
A Deadlock Prevention Policy for Flexible Manufacturing Systems Using Siphons. ICRA (2001)
MuDer Jeng, Xiaolan Xie, Yi-Sheng Huang
Manufacturing Modeling using Process Nets with Resources. ICRA (2000)
Fan-Tien Cheng, Haw Ching Yang, Tsung-Liang Luo, Chengche Feng, MuDer Jeng
Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging. IEEE Trans. Syst. Man Cybern. Part B 30 (5) (2000)
MuDer Jeng, Xiaolan Xie, WenYuan Hung
Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems. IEEE Trans. Syst. Man Cybern. Part B 30 (5) (2000)
MuDer Jeng, Frank DiCesare, Xiaolan Xie
Corrections to "synthesis using resource control nets for modeling shared-resource systems". IEEE Trans. Robotics Autom. 16 (2) (2000)
Xiaolan Xie, MuDer Jeng
ERCN-merged nets and their analysis using siphons. IEEE Trans. Robotics Autom. 15 (4) (1999)
MuDer Jeng, Mao Yu Peng
Augmented reachability trees for 1-place-unbounded generalized Petri nets. IEEE Trans. Syst. Man Cybern. Part A 29 (2) (1999)
MuDer Jeng, Chung Shi Lin, Yi-Sheng Huang
Petri net dynamics-based scheduling of flexible manufacturing systems with assembly. J. Intell. Manuf. 10 (6) (1999)
MuDer Jeng, Xiaolan Xie
Analysis of modularly composed nets by siphons. IEEE Trans. Syst. Man Cybern. Part A 29 (4) (1999)
MuDer Jeng, Xiaolan Xie
Modeling and analysis using Petri nets for semiconductor fabrication. SMC (1998)
MuDer Jeng, Xiaolan Xie
Qualitative analysis and deadlock prevention of a real-world IC wafer fabrication system. SMC (1998)
MuDer Jeng, Xiaolan Xie
Modeling and performance analysis of semiconductor manufacturing systems. SMC (1998)
MuDer Jeng, Xiaolan Xie
Synthesis of extended resource control nets using siphons. SMC (1998)
MuDer Jeng, Wan Der Chiou, YuanLin Wen
Deadlock-free scheduling of flexible manufacturing systems based on heuristic search and Petri net structures. SMC (1998)
MuDer Jeng, Chi Liang Chuang, WenYuan Hung
Performance evaluation of the thin film area in an IC wafer fabrication system using Petri nets. SMC (1998)
MuDer Jeng
A Petri net synthesis theory for modeling flexible manufacturing systems. IEEE Trans. Syst. Man Cybern. Part B 27 (2) (1997)
MuDer Jeng
Petri nets for modeling automated manufacturing systems with error recovery. IEEE Trans. Robotics Autom. 13 (5) (1997)
MuDer Jeng, Frank DiCesare
Synthesis using resource control nets for modeling shared-resource systems. IEEE Trans. Robotics Autom. 11 (3) (1995)
Chuan-Yu Chang, MuDer Jeng
A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes. ICRA (1995)
MuDer Jeng, Frank DiCesare
A review of synthesis techniques for Petri nets with applications to automated manufacturing systems. IEEE Trans. Syst. Man Cybern. 23 (1) (1993)