Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection.
Chuan-Yu ChangSi-Yan LinMuDer JengPublished in: CASE (2005)
Keyphrases
- defect detection
- hopfield neural network
- semiconductor manufacturing
- silicon dioxide
- hybrid neural
- hopfield network
- energy function
- hopfield networks
- feature extraction
- wafer fabrication
- cellular neural networks
- process control
- interior point methods
- learning rules
- textured surfaces
- automated visual inspection
- genetic algorithm
- integrated circuit
- linear programming
- face recognition