Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems.
MuDer JengXiaolan XieWenYuan HungPublished in: IEEE Trans. Syst. Man Cybern. Part B (2000)
Keyphrases
- manufacturing systems
- timed petri nets
- discrete event systems
- petri net
- complex systems
- manufacturing processes
- manufacturing environment
- mathematical modeling
- holonic manufacturing systems
- dynamical systems
- discrete event
- control method
- manufacturing enterprises
- dynamic systems
- computational intelligence
- multi agent systems
- machine learning
- neural network
- assembly line
- mathematical model