A case study of applying regional level-set formulation to post-sawing LED wafer inspection.

ChunHsi Li Chuan-Yu Chang MuDer Jeng Yang-Ting Jeng

Published in: SMC (2010)

Keyphrases

level set
narrow band
prior knowledge
higher order
medical images
active contours
global optimization
shape prior
watershed segmentation
intensity inhomogeneity