ChunHsi Li

Publication Activity (10 Years)

Years Active: 2005-2011
Publications (10 Years): 0

Publications

Chuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng
Wafer defect inspection by neural analysis of region features. J. Intell. Manuf. 22 (6) (2011)
ChunHsi Li, Chuan-Yu Chang, MuDer Jeng
Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection. IEEE Trans. Syst. Man Cybern. Part C 41 (6) (2011)
ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng
A case study of applying regional level-set formulation to post-sawing LED wafer inspection. SMC (2010)
Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng
Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. IEEE Trans. Syst. Man Cybern. Part C 39 (3) (2009)
Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng
An unsupervised neural network approach for automatic semiconductor wafer defect inspection. Expert Syst. Appl. 36 (1) (2009)
Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng
Automatic Die Inspection for Post-sawing LED Wafers. SMC (2009)
YuanLin Wen, ChunHsi Li, MuDer Jeng
Diagnosability Enhancement of Discrete Event Systems. SMC (2006)
YuanLin Wen, ChunHsi Li, MuDer Jeng
A polynomial algorithm for checking diagnosability of Petri nets. SMC (2005)