The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.
Christopher L. HendersonJerry M. SodenCharles F. HawkinsPublished in: ITC (1991)
Keyphrases
- delay insensitive
- cmos technology
- chip design
- floating gate
- random access memory
- high speed
- analog vlsi
- asynchronous circuits
- circuit design
- flip flops
- logic synthesis
- low power
- vlsi circuits
- digital circuits
- power dissipation
- low voltage
- integrated circuit
- logic circuits
- parallel processing
- power consumption
- classical logic
- multi valued
- test cases
- human behavior
- nm technology
- image sensor
- low cost
- metal oxide semiconductor