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IC Failure Analysis: Magic, Mystery, and Science.

Jerry M. SodenRichard E. AndersonChristopher L. Henderson
Published in: IEEE Des. Test Comput. (1997)
Keyphrases
  • database
  • databases
  • multiresolution
  • integrated circuit
  • machine learning
  • multiscale
  • probabilistic model
  • software engineering
  • statistical analysis