Ravi K. Gulati

Publication Activity (10 Years)

Years Active: 1988-1996
Publications (10 Years): 0

Publications

Weiwei Mao, Ravi K. Gulati
Improving Gate Level Fault Coverage by RTL Fault Grading. ITC (1996)
Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati
Structure and Metrology for a Single-wire Analog. ITC (1994)
Weiwei Mao, Ravi K. Gulati
Quietest: A methodology for selecting IDDQ test vectors. J. Electron. Test. 3 (4) (1992)
Ravi K. Gulati, Weiwei Mao, Deepak K. Goel
Testing. ITC (1992)
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
IDDQ testing: A review. J. Electron. Test. 3 (4) (1992)
Ravi K. Gulati, Charles F. Hawkins
Introduction. J. Electron. Test. 3 (4) (1992)
V. Chandramouli, Ravi K. Gulati, Ramaswami Dandapani, Deepak K. Goel
Bridging faults and their implication to PLAs. ITC (1990)
Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti
QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. ICCAD (1990)
Ramaswami Dandapani, Ravi K. Gulati, Deepak K. Goel
Built-in self-test for large embedded CMOS folded PLAs. ICCAD (1988)
Ravi K. Gulati, Deepak K. Goel
An efficient compaction algorithm for test vectors of microprocessors and microcontrollers. ICCAD (1988)