Weiwei Mao

Publication Activity (10 Years)

Years Active: 1986-2024
Publications (10 Years): 5

Top Topics

Markov Random Walk

Partial Matching

Neural Network Model

Top Venues

J. Comput. Inf. Technol.

IEEE Trans. Vis. Comput. Graph.

Publications

Weiwei Mao, Teng Pang, Zhirong Guo, Hongbao Bai, Zhixiong Huang, Xiaoyu Jin
Analysis of the Research Progress of Electromagnetic Railgun Based on CiteSpace. IEEE Access 12 (2024)
Weiwei Mao, Suping Yu, Wenqing Chen
Short-Term Power Load Forecasting Method Based on GRU-Transformer Combined Neural Network Model. J. Comput. Inf. Technol. 32 (1) (2024)
Zhuheng Lu, Weiwei Mao, Yuewei Dai, Weiqing Li, Zhiyong Su
Slicing-Tracking-Detection: Simultaneous Multi-Cylinder Detection From Large-Scale and Complex Point Clouds. IEEE Trans. Vis. Comput. Graph. 28 (12) (2022)
Weiwei Mao, Zhuheng Lu, Yuewei Dai, Weiqing Li, Zhiyong Su
Partial Matching of Large Scale Process Plant Models Using Random Walk on Graphs. IEEE Access 8 (2020)
Bo Zhang, Jinhang Zuo, Weiwei Mao
SmartWAZ: Design and Implementation of a Smart WiFi Access System Assisted by Zigbee. IEEE Access 7 (2019)
Chao Wang, Weiwei Mao, Xiaobo Li, Weisheng Chen, Jing Li
Quantized-data consensus of second-order multi-agent systems with directed topology. ASCC (2013)
Weiwei Mao, Ravi K. Gulati
Improving Gate Level Fault Coverage by RTL Fault Grading. ITC (1996)
Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati
Structure and Metrology for a Single-wire Analog. ITC (1994)
Weiwei Mao, Michael D. Ciletti
Reducing correlation to improve coverage of delay faults in scan-path design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13 (5) (1994)
Weiwei Mao, Ravi K. Gulati
Quietest: A methodology for selecting IDDQ test vectors. J. Electron. Test. 3 (4) (1992)
Ravi K. Gulati, Weiwei Mao, Deepak K. Goel
Testing. ITC (1992)
Weiwei Mao, Michael D. Ciletti
Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. ITC (1992)
Weiwei Mao, Michael D. Ciletti
A quantitative measure of robustness for delay fault testing. EURO-DAC (1992)
Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao
IDDQ testing: A review. J. Electron. Test. 3 (4) (1992)
Weiwei Mao, Michael D. Ciletti
Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage. DAC (1991)
Weiwei Mao, Michael D. Ciletti
Arrangement of latches in scan-path design to improve delay fault coverage. ITC (1990)
Weiwei Mao, Michael D. Ciletti
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9 (8) (1990)
Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti
QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. ICCAD (1990)
Weiwei Mao, Michael D. Ciletti
A Variable Observation Time Method for Testing Delay Faults. DAC (1990)
Weiwei Mao, Michael D. Ciletti
A Simplified Six-waveform Type Method for Delay Fault Testing. DAC (1989)
Weiwei Mao, Michael D. Ciletti
Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation. DAC (1988)
Weiwei Mao, Xieting Ling
Robust test generation algorithm for stuck-open fault in CMOS circuits. DAC (1986)