DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation.
Weiwei MaoMichael D. CilettiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- test generation
- learning algorithm
- test cases
- test sequences
- software testing
- design automation
- machine learning
- test data generation
- supervised learning
- active learning
- artificial intelligence
- open source
- high level
- real world
- object oriented
- software engineering
- training set
- reinforcement learning
- project management
- training data
- case study