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Robust test generation algorithm for stuck-open fault in CMOS circuits.

Weiwei MaoXieting Ling
Published in: DAC (1986)
Keyphrases
  • generation algorithm
  • high speed
  • analog vlsi
  • delay insensitive
  • test data generation
  • circuit design
  • vlsi circuits
  • computationally efficient
  • low cost
  • fault diagnosis
  • low power
  • fault detection
  • low voltage
  • test data