Defect Classes - An Overdue Paradigm for CMOS IC.

Charles F. Hawkins Jerry M. Soden Alan W. Righter F. Joel Ferguson

Published in: ITC (1994)

Keyphrases

integrated circuit
power consumption
real time
multiscale
high speed
defect detection
analog vlsi
database
neural network
information systems
search algorithm
low cost
infrared
power supply
single chip