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Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.

Ali KeshavarziGerhard SchromStephen TangSean MaKeith A. BowmanSunit TyagiKevin ZhangTom LintonNagib HakimSteven G. DuvallJohn BrewsVivek De
Published in: ISLPED (2005)
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