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IDDQ Testing for Deep Submicron ICs: Challenges and Solutions.
Zhanping Chen
Liqiong Wei
Ali Keshavarzi
Kaushik Roy
Published in:
LATW (2002)
Keyphrases
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lessons learned
real world
key issues
application scenarios
deep learning
evolutionary algorithm
solution space
open issues
information retrieval
optimal solution
electron beam
vlsi circuits