A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs.
Bhaskar ChatterjeeManoj SachdevAli KeshavarziPublished in: ITC (2004)
Keyphrases
- random access memory
- fault diagnosis
- analog to digital converter
- power dissipation
- fault detection
- condition monitoring
- high speed
- power consumption
- low voltage
- discrete fourier transform
- frequency domain
- power supply
- low cost
- design considerations
- expert systems
- circuit design
- fourier transform
- nm technology
- block cipher
- analog vlsi
- cmos technology
- magnetic tape
- vlsi circuits
- flip flops
- denoising