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Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

Ali KeshavarziKaushik RoyCharles F. HawkinsManoj SachdevKrishnamurthy SoumyanathVivek De
Published in: ITC (2000)
Keyphrases
  • low cost
  • sensitivity analysis
  • data sets
  • high speed
  • power consumption
  • low power
  • vlsi circuits
  • database
  • information retrieval
  • computer vision
  • input parameters