A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect.

Charles F. Hawkins Ali Keshavarzi Jaume Segura

Published in: DFT (2003)

Keyphrases

key technologies
case study
rapid development
cost effective
data sets
data mining
artificial intelligence
information technology
detection algorithm
detection method
web technologies
database
st century
automatic detection
viewpoint
multimedia
e learning
computer vision