Login / Signup

Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits.

Ali KeshavarziJames W. TschanzSiva G. NarendraVivek DeW. Robert DaaschKaushik RoyManoj SachdevCharles F. Hawkins
Published in: IEEE Des. Test Comput. (2002)
Keyphrases
  • high speed
  • expert systems
  • real world
  • long term
  • current practice
  • real time
  • test set
  • parallel processing
  • circuit design
  • vlsi circuits