Oleg Semenov

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Bayesian Networks

Linear Constraints

Top Venues

Publications

Oleg Semenov, Mark J. Olah, Darko Stefanovic
Cooperative linear cargo transport with molecular spiders. Nat. Comput. 12 (2) (2013)
Darko Stefanovic, Milan N. Stojanovic, Mark J. Olah, Oleg Semenov
Catalytic Molecular Walkers: Aspects of Product Release. ECAL (2013)
Vladimir Varlamov, Ilya Ekhlakov, Sergey Komarov, Nickolay Peskov, Oleg Semenov, Mikhail Stepanov
Новые возможности поиска и графического представления информации базы данных по основным параметрам гигантского дипольного резонанса ядер (New Abilities in Search and Graphical Presentation for Information on the Main Parameters of Giant Dipole Resonance of Atomic Nuclei Data Base). RCDL (2011)
Andrey Malkov, Dmitry Vasiounin, Oleg Semenov
A Review of PVT Compensation Circuits for Advanced CMOS Technologies. Circuits Syst. 2 (3) (2011)
Oleg Semenov, Mark J. Olah, Darko Stefanovic
Multiple Molecular Spiders with a Single Localized Source - The One-Dimensional Case - (Extended Abstract). DNA (2011)
Alexei Kaltchenko, Oleg Semenov
testing. IET Circuits Devices Syst. 1 (6) (2007)
Hossein Sarbishaei, Oleg Semenov, Manoj Sachdev
Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os. CICC (2007)
Andrey Belogolovy, Mikhail Yu. Lyakh, Oleg Semenov, Andrei Ovchinnikov
Throughput of WLAN Systems with LDPC Codes and Adaptive Bit Loading. PIMRC (2006)
Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices. Microelectron. J. 37 (6) (2006)
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. ISQED (2005)
Oleg Semenov, Michael Obrecht, Manoj Sachdev
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET. Microelectron. Reliab. 44 (9-11) (2004)
Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness. Microelectron. Reliab. 44 (9-11) (2004)
Oleg Semenov, Arman Vassighi, Manoj Sachdev
Testing. J. Electron. Test. 19 (3) (2003)
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Thermal Management of High Performance Microprocessors. DFT (2003)
Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC (2003)
Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT (2002)