Login / Signup
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness.
Oleg Semenov
Hossein Sarbishaei
Valery Axelrad
Manoj Sachdev
Published in:
Microelectron. Reliab. (2004)
Keyphrases
</>
low voltage
cmos technology
low power
low cost
design considerations
power consumption
image analysis
spl times