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Impact of Thermal Gradients on Clock Skew and Testing.

Sebastià A. BotaJosé Luis RossellóCarol de BenitoAli KeshavarziJaume Segura
Published in: IEEE Des. Test Comput. (2006)
Keyphrases
  • high speed
  • neural network
  • infrared
  • data sets
  • genetic algorithm
  • expert systems
  • test cases
  • power plant