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Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions.
Ali Keshavarzi
Kaushik Roy
Charles F. Hawkins
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2000)
Keyphrases
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vlsi circuits
low power
low cost
optimal solution
information systems
test data
power consumption
machine learning
image processing
three dimensional
mixed signal