Kevin Cota

Publication Activity (10 Years)

Years Active: 2000-2005
Publications (10 Years): 0

Publications

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC (2005)
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC (2003)
Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS (2002)
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Des. Test Comput. 19 (5) (2002)
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC (2002)
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC (2001)
W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota
Variance reduction using wafer patterns in I_ddQ data. ITC (2000)