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Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
Robert Madge
Manu Rehani
Kevin Cota
W. Robert Daasch
Published in:
VTS (2002)
Keyphrases
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post processing
preprocessing
statistical significance
statistical tests
filtering method
data mining
human experts
projections onto convex sets
domain knowledge
domain specific
image quality
pattern extraction