Variance reduction and outliers: statistical analysis of semiconductor test data.
W. Robert DaaschRobert MadgePublished in: ITC (2005)
Keyphrases
- test data
- variance reduction
- statistical analysis
- gradient estimation
- monte carlo
- sample size
- training data
- test cases
- test set
- bias variance decomposition
- importance sampling
- training set
- data sets
- missing data
- naive bayes classifier
- training and test data
- data points
- confidence intervals
- supervised learning
- prior knowledge
- relational databases
- base classifiers
- search based testing